Articles | Volume 6, issue 3
https://doi.org/10.5194/gchron-6-337-2024
https://doi.org/10.5194/gchron-6-337-2024
Research article
 | 
10 Jul 2024
Research article |  | 10 Jul 2024

Effect of chemical abrasion of zircon on SIMS U–Pb, δ18O, trace element, and LA-ICPMS trace element and Lu–Hf isotopic analyses

Cate Kooymans, Charles W. Magee Jr., Kathryn Waltenberg, Noreen J. Evans, Simon Bodorkos, Yuri Amelin, Sandra L. Kamo, and Trevor Ireland

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Short summary
Zircon is a mineral where uranium decays to lead. Some radiation damage lets lead escape. A method called chemical abrasion (CA) dissolves out the damaged portions of zircon so that remaining zircon retains lead. We compare ion beam analyses of untreated and chemically abraded zircons. The ion beam ages for untreated zircons match the reference values for untreated zircon. The ion beam ages for CA zircon match CA reference ages. Other elements are unaffected by the chemical abrasion process.