Chemical abrasion (CA) is a two-step method for reducing Pb loss where zircon is annealed then partially dissolved. We use secondary ion mass spectrometry (SIMS) to find closed- and open-system zircon domains in zircon that has been chemically abraded, annealed only, or untreated. Raman mapping identifies lattice damage in SIMS spots. Atom probe tomography (APT) results from both the discordant spots and the concordant ones are all homogeneous and identical. Thus, APT cannot distinguish discordant and concordant zircon.