Articles | Volume 7, issue 4
https://doi.org/10.5194/gchron-7-591-2025
https://doi.org/10.5194/gchron-7-591-2025
Short communication/technical note
 | 
04 Dec 2025
Short communication/technical note |  | 04 Dec 2025

Technical note: Investigation into the relationship between zircon structural damage and Pb mobility using chemical abrasion, SIMS, Raman spectroscopy, and atom probe tomography

Charles W. Magee Jr., Lutz Nasdala, Renelle Dubosq, Baptiste Gault, and Simon Bodorkos

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Short summary
Chemical abrasion (CA) is a two-step method for reducing Pb loss where zircon is annealed then partially dissolved. We use secondary ion mass spectrometry (SIMS) to find closed- and open-system zircon domains in zircon that has been chemically abraded, annealed only, or untreated. Raman mapping identifies lattice damage in SIMS spots. Atom probe tomography (APT) results from both the discordant spots and the concordant ones are all homogeneous and identical. Thus, APT cannot distinguish discordant and concordant zircon.
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